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haracteristic materials / consumables
Nano Silica Suspension
AFM tips
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Tekna Spheroidized Powder/ Nano Powder
Process equipment
Atomic Deposition System Anric
Meiwafosis Pre-processing System for Point Microscope
Plasma-enhanced chemical vapor deposition system for TEOS multi-wafer processing
Inductively Coupled Plasma Etching System with Multiple Chambers
Plasma-Enhanced Chemical Vapor Deposition System (PECVD)
Plasma-Enhanced Chemical Vapor Deposition System PP1000 PECVD
Physical Vapor Deposition System PVD
Atomic Layer Deposition System FlexAL ALD
Electron Microscope High-Resolution Osmium Coating Machine
Measuring / Analyzing Instruments
OEG Optical Measurement
SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument
SITA cleainess/ tension meter/ foam analysis
VINE Film Thickness Measurement
TEMIC SEM Tabletop Electron Microscope (Solid/Liquid)
XPS/ESCA X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
Precision X-ray Cabinet Irradiator for Cells/Animals
Unisoku
IMAGE
SPM Surface Morphology Analysis
STM Surface Morphology Analysis
SEM Surface Morphology Analysis
Nano-indenter Material Stress-Strain Analysis
Factory gas detector
CM4 Paper Tape Gas Detector
Vertex Paper Tape Gas Detector
Vertex-M Paper Tape Gas Detector
MIDAS Electrochemical Gas Detector
MIDAS-M Electrochemical Gas Detector
Satellite XT Electrochemical Gas Detector
ACM 150 FT-IR Gas Monitoring System
Sensepoint XCD Explosion-proof Gas Detector
RAEGuard 2 PID Volatile Organic Compound (VOC) Detector
SPM Flex Paper Tape Gas Detector
MIDAS Portable Gas Detector
BW Clip4 Multi-gas Portable Detector
BW Ultra Multi-gas Portable Detector
BW Solo Portable Detector
Riken Electrochemical Detector
Vertex Edge紙帶式氣體偵測器
Chemcassette Toxic Gas Detection
Electrochemical Gas Detector
FT-IR Centralized Gas Monitoring System
Explosion-proof Gas Detector
Portable Gas Detector
Manufacturing / production equipment
OIPT
CVI
TANKA Nanomaterials and Spherical Material Preparation Equipment
SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument
Wafer Cleaving Machine SELA
semiconductor
Particle Deposition System
Particle Deposition Services
SELA
X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
HoneyWell
Academic field
Cryogenic System Bluefors
Cryogenic System CIA
Scanning Tunneling Microscope RHK
Scanning Tunneling Microscope Unisoku
High-Temperature Equipment CVI
X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
Qdevil Quantum/Low-Temperature Electronic Components
Quantum research
Toxic Gas Monitoring System Integration
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Thermo Fisher Scientific
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HONEYWELL
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semiconductor
Integrated Gas Detection System and Facility Monitoring
Thermo Fisher Scientific
Measurement/Analysis Instruments
MSP
Specialty Materials/Consumables
semiconductor
SURAGUS
Manufacturing/Production Equipment
TEMIC
Measurement/Analysis
SELA
Manufacturing/Production Equipment
SITA
Measurement/Analysis
GRAFENIA
Micro-dusting service
OEG
Optical Measurement
Nano Silica
AppNano
MIKROMASCH
NanoWord
Specialty Materials/Consumables
BugetSensors
GRAPHENE
XG Science
Specialty Materials/Consumables
Graphenea
Specialty Materials/Consumables
CIA
Academic Field
BlueFors
Academic Field
Anric
Process Equipment
Meiwafosis
Process Equipment
VINE
Measurement/Analysis
TEMIC
TVGS
Faxitron Bioptics,LLC
Unisoku
Measurement/Analysis Instrument
Academic Field
RHK
Academic field
Analysis/Detection Equipment
IMAGE
Measurement/Analysis Instrument
JAG
OIPT
Manufacturing equipment
CVI
Manufacturing/Production Equipment
CNT
TEKNA
Manufacturing/production equipment
Precision
Measurement/Analysis
Scanning Probe Image Processing Software
Scanning Probe Image Processing Software
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