Product Information/ PRODUCTS /Semiconductor - Static or dynamic contact angle measurement, surface wetting assessment, and surface free energy of components

Nano Silica Suspension AFM tips GRAPHENE Tekna Spheroidized Powder/ Nano Powder

Atomic Deposition System Anric Meiwafosis Pre-processing System for Point Microscope Plasma-enhanced chemical vapor deposition system for TEOS multi-wafer processing Inductively Coupled Plasma Etching System with Multiple Chambers Plasma-Enhanced Chemical Vapor Deposition System (PECVD) Plasma-Enhanced Chemical Vapor Deposition System PP1000 PECVD Physical Vapor Deposition System PVD Atomic Layer Deposition System FlexAL ALD Electron Microscope High-Resolution Osmium Coating Machine

OEG Optical Measurement SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument SITA cleainess/ tension meter/ foam analysis VINE Film Thickness Measurement TEMIC SEM Tabletop Electron Microscope (Solid/Liquid) XPS/ESCA X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis Precision X-ray Cabinet Irradiator for Cells/Animals Unisoku IMAGE SPM Surface Morphology Analysis STM Surface Morphology Analysis SEM Surface Morphology Analysis Nano-indenter Material Stress-Strain Analysis

CM4 Paper Tape Gas Detector Vertex Paper Tape Gas Detector Vertex-M Paper Tape Gas Detector MIDAS Electrochemical Gas Detector MIDAS-M Electrochemical Gas Detector Satellite XT Electrochemical Gas Detector ACM 150 FT-IR Gas Monitoring System Sensepoint XCD Explosion-proof Gas Detector RAEGuard 2 PID Volatile Organic Compound (VOC) Detector SPM Flex Paper Tape Gas Detector MIDAS Portable Gas Detector BW Clip4 Multi-gas Portable Detector BW Ultra Multi-gas Portable Detector BW Solo Portable Detector Riken Electrochemical Detector Vertex Edge紙帶式氣體偵測器 Chemcassette Toxic Gas Detection Electrochemical Gas Detector FT-IR Centralized Gas Monitoring System Explosion-proof Gas Detector Portable Gas Detector

OIPT CVI TANKA Nanomaterials and Spherical Material Preparation Equipment SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument Wafer Cleaving Machine SELA

Particle Deposition System Particle Deposition Services SELA X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis HoneyWell

Cryogenic System Bluefors Cryogenic System CIA Scanning Tunneling Microscope RHK Scanning Tunneling Microscope Unisoku High-Temperature Equipment CVI X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis Qdevil Quantum/Low-Temperature Electronic Components Quantum research