Product Information/ PRODUCTS / Non-contact-sheet resistance and film thickness measuring instrument EddyCus® TF lab 2020SR series
Non-contact-sheet resistance and film thickness measuring instrument EddyCus® TF lab 2020SR seriesEddyCus® TF lab 2020SR series
specification：
Sheet Resistance (Rs) Measurement The EddyCus® TF lab series is specifically designed for the measurement of conductive thin films on glass, wafers, plastics, or foils. It provides a non-contact, single-point method for real-time measurement of film thickness and sheet resistance. These instruments are also suitable for the real-time measurement of the thickness of conductive materials such as metal foils and metal sheets.
DESCRIPTION
Product Description
Sheet Resistance (Rs) Measurement The EddyCus® TF lab series is specifically designed for the measurement of conductive thin films on glass, wafers, plastics, or foils. It provides a non-contact, single-point method for real-time measurement of film thickness and sheet resistance. These instruments are also suitable for the real-time measurement of the thickness of conductive materials such as metal foils and metal sheets.
Applications:
· Architectural glass
· Touchscreens and flat panel displays
· OLED and LED applications
· Smart glass applications
· Transparent antistatic films
· Solar cells
· De-icing and heating applications
· Graphene conductivity measurement
ITO/PET
Ag nanowires
