Product Information/ PRODUCTS /Scanning Probe Image Processing Software Brand
Scanning Probe Image Processing Software BrandImage Metrology
specification：
SPIP is a professional-level micro and nanoscale image analysis software. Currently, it is used by thousands of major research institutions in over 60 countries worldwide. It supports various imaging inspection techniques, including scanning probe microscopy, atomic force microscopy, scanning tunneling microscopy, electron microscopy, transmission electron microscopy, interferometry, confocal microscopy, optical microscopy, and more.
Contact window： sales@scientek-co.com
DESCRIPTION
Currently, it has 13 specific functions and provides services in fields such as semiconductor inspection, physics, chemistry, biology, metrology, nanotechnology, and more.
The functions are as follows:
- Basic surface analysis function
- ImageMet image management module
- 3D visualization module
- Image filtering module
- Roughness analysis module
- Particle and pore size analysis module
- Extended Fourier analysis function
- Batch processing function
- Force curve analysis function
- Probe characteristic analysis module
- Calibration function module
- Image capturing and time series module
- CITS spectral function
