Product Information/ PRODUCTS /Low-temperature atomic force/scanning tunneling microscope LT AFM/STM
Low-temperature atomic force/scanning tunneling microscope LT AFM/STMLow-temperature atomic force/scanning tunneling microscope LT AFM/STM
specification：
The QuadraProbe four-probe surface analysis system ensures long-term stable operation of samples and four STM probes at 10K, with each probe achieving atomic-level resolution. A high-resolution SEM is positioned above the four probes for coarse positioning and navigation of the probes. The sample analysis chamber is also equipped with XPS, UPS, ISS, Auger, LEED, and SAM capabilities. RHK Corporation integrates the state-of-the-art R9 controller into the QuadraProbe system, allowing users to have independent control over the four probes.
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DESCRIPTION
The QuadraProbe four-probe surface analysis system ensures long-term stable operation of samples and four STM probes at 10K, with each probe achieving atomic-level resolution. A high-resolution SEM is positioned above the four probes for coarse positioning and navigation of the probes. The sample analysis chamber is also equipped with XPS, UPS, ISS, Auger, LEED, and SAM capabilities. RHK Corporation integrates the state-of-the-art R9 controller into the QuadraProbe system, allowing users to have independent control over the four probes.