Product Information/ PRODUCTS /Pan-type Low-Temperature Atomic Force/Scanning Tunneling Microscope LT AFM/STM
Pan-type Low-Temperature Atomic Force/Scanning Tunneling Microscope LT AFM/STMPan-type Low-Temperature Atomic Force/Scanning Tunneling Microscope LT AFM/STM
specification：
The Pan-type Low-Temperature Scanning Probe Microscope (SPM) system is manufactured by RHK Technology, USA. Its main features include:
- Compact PAN STM/AFM scanning head (2.96" x 1.55").
- Large range of sample movement in X-Y-Z directions (5mm x 5mm x 10mm).
- Operating temperature ranges from ultra-low temperatures of 300mK, room temperature, variable temperature, to high temperatures.
- Built-in spring and eddy current damping vibration system for in-situ probe and sample exchange.
- Compatible with various Flow-type or Bath-type low-temperature cryostats and magnets.
- Used in conjunction with the latest all-digital R9 controller from RHK.
- Suitable for surface science research in topological insulators, low-temperature superconductors, surface structures, electrical measurements, and other surface-related studies.
Contact window： sales@scientek-co.com
DESCRIPTION
The Pan-type Low-Temperature Scanning Probe Microscope (SPM) system is manufactured by RHK Technology, USA. Its main features include:
- Compact PAN STM/AFM scanning head (2.96" x 1.55").
- Large range of sample movement in X-Y-Z directions (5mm x 5mm x 10mm).
- Operating temperature ranges from ultra-low temperatures of 300mK, room temperature, variable temperature, to high temperatures.
- Built-in spring and eddy current damping vibration system for in-situ probe and sample exchange.
- Compatible with various Flow-type or Bath-type low-temperature cryostats and magnets.
- Used in conjunction with the latest all-digital R9 controller from RHK.
- Suitable for surface science research in topological insulators, low-temperature superconductors, surface structures, electrical measurements, and other surface-related studies.
