Product Information/ PRODUCTS /Variable-temperature atomic force/scanning tunneling microscope VT AFM/STM
Variable-temperature atomic force/scanning tunneling microscope VT AFM/STMVariable-temperature atomic force/scanning tunneling microscope VT AFM/STM
specification：
The RHK Variable-Temperature/Variable-Field Scanning Probe Microscope (STM/AFM) has the following five characteristics:
- Continuous variation of magnetic field during SPM scanning without the need to retract the SPM probe.
- The applied magnetic field is in-plane and can reach up to 10,000 Gauss; sample size is approximately 1cm.
- Utilizes an electromagnet to provide reversible and continuous variation of the magnetic field.
- Precise control of magnetic field intensity with excellent repeatability.
- The application of magnetic field has no impact on SPM scanning accuracy, resolution, stability, and vibration isolation.
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DESCRIPTION
The RHK Variable-Temperature/Variable-Field Scanning Probe Microscope (STM/AFM) has the following five characteristics:
- Continuous variation of magnetic field during SPM scanning without the need to retract the SPM probe.
- The applied magnetic field is in-plane and can reach up to 10,000 Gauss; sample size is approximately 1cm.
- Utilizes an electromagnet to provide reversible and continuous variation of the magnetic field.
- Precise control of magnetic field intensity with excellent repeatability.
- The application of magnetic field has no impact on SPM scanning accuracy, resolution, stability, and vibration isolation.
