ThermoFisher Nexsa G2 表面分析系統帶有自動表面分析和多技術能力的X射線光電子能譜儀。X射線光電子能譜

規格：

Analyzer type	180°, double-focusing, hemispherical analyzer with 128-channel detector
X-ray source type	Monochromated, micro-focused, low-power Al K-Alpha X-ray source
X-ray spot size	10–400 µm (adjustable in 5 µm steps)
Depth profiling	EX06 monatomic ion source or MAGCIS dual-mode ion source
Maximum Sample area	60 x 60 mm
Maximum sample thickness	20 mm
Vacuum system	Two turbo molecular pumps, with automated titanium sublimation pump and backing pump
Optional accessories	UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration

聯繫窗口：

詢價車原廠連結

DESCRIPTION

Thermo Scientific Nexsa G2 X射線光電子能譜儀（XPS）系統提供全自動，高通量的表面分析，提供數據以推動研究和開發，或解決生產問題。將XPS與離子散射光譜學（ISS）、紫外光電子能譜學（UPS）、反射電子能量損失光譜學（REELS）和拉曼光譜學整合，使您能夠進行真正的相關分析。系統現在包括樣品加熱和樣品偏壓能力的選項，以擴大現在可能的實驗範圍。Nexsa G2 表面分析系統開啟了材料科學、微電子學、納米技術開發以及許多其他應用的進步潛力。

Key Features

High-performance X-ray source

A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.

Optimized electron optics

The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing

Bring sample features into focus with the Nexsa XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image.

Insulator analysis

The patented dual-beam flood source couples low-energy ion beams with very low-energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need for charge referencing, making the analysis of the data from insulating samples easy and reliable.

Depth profiling

Go beyond the surface with a standard ion source or MAGCIS, the optional dual-mode monatomic and gas cluster ion source; automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Optional sample holders

Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.

Digital Control

Instrument control, data processing, and reporting are all controlled from the Windows Software-based Avantage data system.

NX sample heater module

Fully software-controlled sample heating option, enabling temperature-dependent studies.

產品資訊

產品資訊/ PRODUCTS /ThermoFisher Nexsa G2 表面分析系統帶有自動表面分析和多技術能力的X射線光電子能譜儀。X射線光電子能譜