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Vine Thin Film Thickness Measurement Instrument
Vine Thin Film Thickness Measurement Instrument
Vine Thin Film Thickness Measurement Instrument
Vine Thin Film Thickness Measurement Instrument

Vine Thin Film Thickness Measurement InstrumentVine Thin Film Thickness Measurement Instrument

specification：

  1. Nano to micro-scale thickness measurement range (500 nm - 400 ㎛)
  2. Non-contact and non-destructive testing
  3. Applicable to various substrates (wafer, glass, metal, plastic, etc.)
  4. Easy and fast operation

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DESCRIPTION

Applications:
§ Semiconductor: SiO2, Si3N4, SiC, TiO2, nitride coatings, photoresist (e.g., SU-8)
§ Flat panel displays, touch panels, solar cells: TCO, CdS, CIGS, ZnO, cell gaps, ITO, MgO, Al2O3
§ PCB protective coatings
§ Hard coatings
§ Contact lens coatings
§ Films: PET, PMMA, PE, coated films, acrylic resins, AR coatings