EddyCus® TF Mapping SeriesEddyCus® TF Mapping Series

specification:
Rs (Sheet Resistance) Measurement EddyCus® TF Mapping Series is specially designed for the measurement of conductive thin films (TCO) on glass, wafers, plastics, or foils. It is a single-point automated non-contact method that allows for the measurement of 2D mapping of sheet resistance values and film thickness distribution. It is suitable for materials such as ITO, metal foils, metal sheets, carbon fiber, and more.

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DESCRIPTION

Product Description
Rs (Sheet Resistance) Measurement EddyCus® TF Mapping Series is specially designed for the measurement of conductive thin films (TCO) on glass, wafers, plastics, or foils. It is a single-point automated non-contact method that allows for the measurement of 2D mapping of sheet resistance values and film thickness distribution. It is suitable for materials such as ITO, metal foils, metal sheets, carbon fiber, and more.
 

Applications:

  • Architectural glass
  • Touchscreens and flat panel displays
  • OLED and LED applications
  • Smart glass applications
  • Transparent anti-static films
  • Solar cells
  • Deicing and heating applications
  • Graphene conductivity measurement
  • ITO/PET