Product Information/ PRODUCTS /Low-temperature Ultra-high Vacuum Scanning Tunneling Microscope LT UHV SPM USM1200
Low-temperature Ultra-high Vacuum Scanning Tunneling Microscope LT UHV SPM USM1200Low-temperature Ultra-high Vacuum Scanning Tunneling Microscope
specification：
Features
● Single-layer dewar, easy to use, excellent low-temperature performance.
● Built-in lens platform, suitable for various optical measurements.
● Capable of low-temperature in-situ atomic and molecular evaporation.
Applications
● STM (Scanning Tunneling Microscopy) measurements and IETS (Inelastic Electron Tunneling Spectroscopy) measurements at low temperatures.
● AFM (Atomic Force Microscopy) measurements and extended functionalities such as MFM (Magnetic Force Microscopy)/EFM (Electric Force Microscopy) at low temperatures.
● Photoluminescence STM and AFM measurements.
● Low-temperature tunneling-induced luminescence and optically enhanced Raman spectroscopy measurements.
DESCRIPTION
Product Description
Low-Temperature Ultra-High Vacuum Scanning Tunneling Microscope (USM-1200)
The USM-1200 system allows stable image scanning and dI/dV spectroscopy measurements at liquid nitrogen or liquid helium temperatures. The improved low-temperature Dewar reduces liquid helium consumption and lowers operating costs.
Features
● Single-layer dewar, easy to use, excellent low-temperature performance.
● Built-in lens platform, suitable for various optical measurements.
● Capable of low-temperature in-situ atomic and molecular evaporation.
Applications
● STM (Scanning Tunneling Microscopy) measurements and IETS (Inelastic Electron Tunneling Spectroscopy) measurements at low temperatures.
● AFM (Atomic Force Microscopy) measurements and extended functionalities such as MFM (Magnetic Force Microscopy)/EFM (Electric Force Microscopy) at low temperatures.
● Photoluminescence STM and AFM measurements.
● Low-temperature tunneling-induced luminescence and optically enhanced Raman spectroscopy measurements.
