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    • Superconducting Quantum Computers
      • Spark 5-qubits 量子電腦
    • Process equipment
      • Atomic Deposition System Anric
      • Meiwafosis Pre-processing System for Point Microscope
      • Plasma-enhanced chemical vapor deposition system for TEOS multi-wafer processing
      • Inductively Coupled Plasma Etching System with Multiple Chambers
      • Plasma-Enhanced Chemical Vapor Deposition System (PECVD)
      • Plasma-Enhanced Chemical Vapor Deposition System PP1000 PECVD
      • Physical Vapor Deposition System PVD
      • Atomic Layer Deposition System FlexAL ALD
      • Electron Microscope High-Resolution Osmium Coating Machine
    • Measuring / Analyzing Instruments
      • OEG Optical Measurement
      • SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument
      • SITA cleainess/ tension meter/ foam analysis
      • VINE Film Thickness Measurement
      • XPS/ESCA X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
      • Precision X-ray Cabinet Irradiator for Cells/Animals
      • Unisoku
      • IMAGE
      • SPM Surface Morphology Analysis
      • STM Surface Morphology Analysis
      • SEM Surface Morphology Analysis
      • Nano-indenter Material Stress-Strain Analysis
    • Factory gas / Liquid Leak detector
      • Chemcassette Toxic Gas Detection
      • Electrochemical Gas Detector
      • FT-IR Centralized Gas Monitoring System
      • Explosion-proof Gas Detector
      • Portable Gas Detector
      • Liquid leak film detection
    • Manufacturing / production equipment
      • OIPT
      • CVI
      • TANKA Nanomaterials and Spherical Material Preparation Equipment
      • SURAGUS Non-Contact - Sheet Resistance and Film Thickness Measurement Instrument
      • Wafer Cleaving Machine SELA
    • semiconductor
      • Particle Deposition System
      • Particle Deposition Services
      • SELA
      • X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
      • Honeywell
    • Academic field
      • Cryogenic System Bluefors
      • Cryogenic System CIA
      • Scanning Tunneling Microscope RHK
      • Scanning Tunneling Microscope Unisoku
      • High-Temperature Equipment CVI
      • X-ray Photoelectron Spectroscopy/X-ray Photoelectron Spectroscopy for Chemical Analysis
      • Quantum research
    • Toxic Gas Monitoring System Integration
    • haracteristic materials / consumables
      • Nano Silica Suspension
      • AFM tips
      • GRAPHENE
      • Tekna Spheroidized Powder/ Nano Powder
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ISO 45001 CHT
ISO 45001 ENG
  • 3F, No.53 Jinggong Road, Xinfeng Township, Hsinchu County 30443
  • TEL：03-559-0909
  • FAX：03-559-0298
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